Siltech uses various assay technologies to determine the precious metal purity.
XRF (X-ray Fluorescence) is a technique of determining different metal content by bombarding the sample with X-rays or gamma rays. The metal sample is held in a stand and the XRF device measures the metal contents at a point; this can be completed several times for the same sample to get a good result.
- Inductively coupled plasma atomic emission spectroscopy - for this a pin sample or drill sample is taken and then an emission spectrometer is measured. This technique is best for detection of trace metals.
- Potentiometric titration is a type of titration. Unlike redox, no indicator is used; instead two electrodes are used to measure the potential across the analyte compared to the reference electrode.
By using the XRF assay technique Siltech can provide an approximate valuation for precious metal scrap.